发明申请
- 专利标题: DETECTION OF MAGNETIC PARTICLES AND THEIR CLUSTERING
- 专利标题(中): 检测磁性颗粒及其聚集
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申请号: US13705000申请日: 2010-11-30
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公开(公告)号: US20130088221A1公开(公告)日: 2013-04-11
- 发明人: Joannes Baptist Adrianus Dionisius Van Zon , Mkhail Mikhaylovich Ovsyanko , Toon Hendrik Evers , Mara Johanna Jacoba Sijbers
- 申请人: Joannes Baptist Adrianus Dionisius Van Zon , Mkhail Mikhaylovich Ovsyanko , Toon Hendrik Evers , Mara Johanna Jacoba Sijbers
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP10166839.0 20100622
- 国际申请: PCT/IB2010/055495 WO 20101130
- 主分类号: G01N27/72
- IPC分类号: G01N27/72
摘要:
The invention relates to a method and associated apparatuses (100) for the detection of magnetic particles (MP) in a sample chamber (111). The method comprises the determination of a “particle-parameter” that is related to the amount of magnetic particles (MP) in a first detection region (P, C), the determination of a “cluster-parameter” that is related to the degree of clustering of magnetic particles (MP) in a second detection region (P, C), and the evaluation of the particle-parameter based on the cluster-parameter. Various apparatuses are disclosed that can be applied in said method. In one apparatus (100), a magnetic field (B) is generated in the sample chamber (111) in such a way that it has different inclinations in a first and second field region (P, C) and/or that it is oblique to the binding surface (112) in at least one field region. Magnetic particles (MP) are then detected in said first and second field region and/or in said at least one field region before and after a permanent switch-off of the inclined magnetic field. The resulting detection signals are related to each other to determine a cluster-parameter. In other embodiments, a cluster-parameter may be determined from light transmission measurements during the application of a magnetic field that is switched on and off.
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