发明申请
- 专利标题： LOAD CARD FOR TESTING PERIPHERAL COMPONENT INTERCONNECT SLOTS
- 专利标题（中）： 用于测试外围组件连接器的负载卡
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申请号： US13337063申请日： 2011-12-24
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公开(公告)号： US20130103879A1公开(公告)日： 2013-04-25
- 发明人: CHAO-KE WEI , BO TIAN , ZE-YUN WU
- 申请人： CHAO-KE WEI , BO TIAN , ZE-YUN WU
- 申请人地址： TW Tu-Chengei
- 专利权人： HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人： HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址： TW Tu-Chengei
- 优先权： CN201110325632.1 20111024
- 主分类号： G06F13/20
- IPC分类号： G06F13/20
摘要：
A load card for testing different types of PCI slots is provided. The load card includes several gold fingers, and resistor selection circuits. Each gold finger corresponds to one PCI slot. Each resistor selection circuit includes a resistor to test at least one PCI slot working in one working voltage. When a PCI slot working at a working voltage is to be tested, the gold finger connects to the PCI slot, and the resistor selection circuit including the resistor to test the PCI slot working at the working voltage is enabled and others are disabled in response to an operation of the user.
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