发明申请
- 专利标题: TESTING DEVICE FOR PLANENESS
- 专利标题(中): 测试设备
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申请号: US13418364申请日: 2012-03-13
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公开(公告)号: US20130104412A1公开(公告)日: 2013-05-02
- 发明人: XIAN-GANG FAN
- 申请人: XIAN-GANG FAN
- 申请人地址: TW Tu-Cheng CN Shenzhen City
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HON FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HON FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- 当前专利权人地址: TW Tu-Cheng CN Shenzhen City
- 优先权: CN201110333565.8 20111028
- 主分类号: G01B5/25
- IPC分类号: G01B5/25
摘要:
A testing device for testing whether planeness of top and bottom surfaces of an object is within an allowable range includes a rack, a motion mechanism, a transmission mechanism, a control mechanism, a testing mechanism, and a display. The motion mechanism is slidably connected to the rack and supporting the object. The transmission mechanism is fastened to the rack and the motion mechanism. The testing mechanism includes two separated rows of sensors. The object extends through the testing mechanism, between the rows of sensors. The sensors above the object measure distances between the sensors and corresponding dots of a top surface of the object. The sensors below the object measure distances between the sensors and corresponding dots of a bottom surface of the object. The sensors send signals about the distances to the control mechanism.
公开/授权文献
- US08650768B2 Testing device for planeness 公开/授权日:2014-02-18
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