发明申请
- 专利标题： STRAIN MEASUREMENT APPARATUS, LINEAR EXPANSION COEFFICIENT MEASUREMENT METHOD, AND CORRECTION COEFFICIENT MEASUREMENT METHOD FOR TEMPERATURE DISTRIBUTION DETECTOR
- 专利标题（中）： 应变测量装置，线性膨胀系数测量方法和温度分布检测器的校正系数测量方法
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申请号： US13658424申请日： 2012-10-23
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公开(公告)号： US20130107004A1公开(公告)日： 2013-05-02
- 发明人: Osamu Maeda , Satoshi Ohya
- 申请人： Osamu Maeda , Satoshi Ohya
- 优先权： JP2011-234901 20111026
- 主分类号： G01B11/16
- IPC分类号： G01B11/16 ; H04N13/02
摘要：
A strain measurement apparatus includes: a stereo camera device that produces a first stereo image and a second stereo image of a measurement object; an actual strain calculation portion configured to find a three-dimensional configuration of the measurement object from the first stereo image and the second stereo image to find actual strain of the measurement object; a temperature distribution detector that detects a temperature distribution of the measurement object; a free thermal strain calculation portion configured to find free thermal strain of the measurement object from the temperature distribution detected by the temperature distribution detector; and a constraint strain calculation portion configured to find as constraint strain of the measurement object a difference obtained by subtracting the free thermal strain found by the free thermal strain calculation portion from the actual strain found by the actual strain calculation portion.
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