Invention Application
US20130116572A1 METHOD AND APPARATUS FOR MEASURING 3-DIMENSIONAL OBJECT SHAPE BASED ON SHADOWS
审中-公开
用于测量基于阴影的三维对象形状的方法和装置
- Patent Title: METHOD AND APPARATUS FOR MEASURING 3-DIMENSIONAL OBJECT SHAPE BASED ON SHADOWS
- Patent Title (中): 用于测量基于阴影的三维对象形状的方法和装置
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Application No.: US13645654Application Date: 2012-10-05
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Publication No.: US20130116572A1Publication Date: 2013-05-09
- Inventor: Seong-Ho SON , Hyuk Je KIM , Jong Moon LEE , Bo Ra KIM , Soon Ik JEON , Hyung Do CHOI
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Priority: KR10-2011-0115888 20111108
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
An apparatus measures a 3-Dimensional (3D) shape of an object. The apparatus includes a light emitting unit and a light receiving unit that are arranged to face each other with the object disposed in a space defined therebetween, wherein the light transmitting unit being arranged to scan the object, and the light receiving unit being arranged to sense a shadow of the scanned object formed thereon. The apparatus includes a rotation unit arranged to rotate the light emitting unit and the light receiving unit about a same rotational axis by a preset rotation angle until the rotation is fully made by a desired target angle and a shape restoration unit configured to measure a 3D shape of the object using shadows that are obtained for each preset rotation angle.
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