Invention Application
- Patent Title: SELF-TIMED ERROR CORRECTING CODE EVALUATION SYSTEM AND METHOD
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Application No.: US13731658Application Date: 2012-12-31
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Publication No.: US20130117628A1Publication Date: 2013-05-09
- Inventor: James B. Johnson
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Main IPC: H03M13/05
- IPC: H03M13/05

Abstract:
Error correcting codes (ECCs) have been proposed to be used in high frequency memory devices to detect errors in signals transmitted between a memory controller and a memory device. For high frequency memory devices, ECCs have delay characteristics of greater than one clock cycle. When the delay exceeds one clock cycle but is much less than two clock cycles, an entire second clock cycle must be added. By calculating and comparing the ECC value in a static logic circuit and a dynamic logic circuit, the logic delay is substantially reduced. In addition, the ECC value may be calculated and compared using two sets of static logic gates, where the second static logic gate is clocked by a clock signal that is delayed relative to the clock signal of the first set of logic gates.
Public/Granted literature
- US08555127B2 Self-timed error correcting code evaluation system and method Public/Granted day:2013-10-08
Information query
IPC分类: