发明申请
- 专利标题: TESTING APPARATUS
- 专利标题(中): 测试装置
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申请号: US13473679申请日: 2012-05-17
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公开(公告)号: US20130145860A1公开(公告)日: 2013-06-13
- 发明人: WEI-MIN QIN , CONG-XU HU , YU-LIN LIU
- 申请人: WEI-MIN QIN , CONG-XU HU , YU-LIN LIU
- 申请人地址: TW Tu-Cheng CN Wuhan City
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (WUHAN) CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.,HONG FU JIN PRECISION INDUSTRY (WUHAN) CO., LTD.
- 当前专利权人地址: TW Tu-Cheng CN Wuhan City
- 优先权: CN201110402877.X 20111207
- 主分类号: G01N3/08
- IPC分类号: G01N3/08
摘要:
A testing apparatus includes a retaining panel, a screw pole, two securing panels moveably attached to the screw pole, and two mounting members. Each of the two securing panels is slidably attached to the retaining panel. Each of the two mounting member is engaged with each of the two securing panels. The two securing panels are moveable relative to the screw pole for sandwiching an electronic device, and each of the two mounting member is engaged with the screw pole, for prevent the two securing panels from disengaged from the electronic device.
公开/授权文献
- US08650964B2 Testing apparatus 公开/授权日:2014-02-18
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