发明申请
- 专利标题: Landing Areas of Bonding Structures
- 专利标题(中): 粘结结构的着陆区
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申请号: US13313333申请日: 2011-12-07
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公开(公告)号: US20130147030A1公开(公告)日: 2013-06-13
- 发明人: Chih-Horng Chang , Tin-Hao Kuo , Chen-Shien Chen
- 申请人: Chih-Horng Chang , Tin-Hao Kuo , Chen-Shien Chen
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: H01L23/498
- IPC分类号: H01L23/498
摘要:
A device includes a first and a second package component. A metal trace is disposed on a surface of the first package component. The metal trace has a lengthwise direction. The metal trace includes a portion having an edge, wherein the edge is not parallel to the lengthwise direction of the metal trace. The second package component includes a metal pillar, wherein the second package component is disposed over the first package component. A solder region bonds the metal pillar to the metal trace, wherein the solder region contacts a top surface and the edge of the portion of the metal trace.
公开/授权文献
- US09257385B2 Landing areas of bonding structures 公开/授权日:2016-02-09
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