A test method includes: setting test parameters for a test of a plurality of electronic devices in response to a user input; generating a control signal according to the test parameters and sending the control signal to a baseboard management controller of each electronic device to control the baseboard management controller to test the corresponding electronic devices according to the parameter set by the user, and recording the number of the time that the start and shut down operation have been done and the test values which can reflect the running state of the electronic devices in a test file; analyzing the stability of each electronic device by analyzing the test result record in the test file. A test device and computer-readable medium are also disclosed.