发明申请
- 专利标题: ATTRIBUTE INFORMATION PROCESSING DEVICE, ATTRIBUTE INFORMATION PROCESSING METHOD AND ATTRIBUTE INFORMATION EVALUATION SYSTEM
- 专利标题(中): 属性信息处理设备,属性信息处理方法和属性信息评估系统
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申请号: US13822984申请日: 2011-06-28
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公开(公告)号: US20130173620A1公开(公告)日: 2013-07-04
- 发明人: Takao Takenouchi
- 申请人: Takao Takenouchi
- 申请人地址: JP Tokyo
- 专利权人: NEC CORPORATION
- 当前专利权人: NEC CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2010-211521 20100922
- 国际申请: PCT/JP2011/003676 WO 20110628
- 主分类号: G06F17/30
- IPC分类号: G06F17/30
摘要:
An attribute information processing device includes: an attribute information acquiring unit that acquires attribute information; an attribute value acquiring unit that acquires at least two types of attribute values including a first-type attribute value and a second-type attribute value corresponding to an attribute value of the acquired attribute information; a generating unit that determines a function for obtaining an evaluation value from the acquired two or more types of attribute values, determines a acquisition source of the first-type attribute value to be a first-attribute providing device that can provide the first-type attribute value concerning attribute information serving as a comparison target, determines an acquisition source of the second-type attribute value to be a second-attribute providing device different from the first-attribute providing device, and generates attribute evaluation information containing information on the function, an evaluation value, information for identifying the first-attribute providing device, and information for identifying the second-attribute providing device; and an output unit that outputs the second-type attribute value and the attribute evaluation information.
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