发明申请
US20130175431A1 DETECTOR HAVING LARGE AREA AND METHOD OF MANUFACTURING THE SAME
审中-公开
具有大面积检测器及其制造方法
- 专利标题： DETECTOR HAVING LARGE AREA AND METHOD OF MANUFACTURING THE SAME
- 专利标题（中）： 具有大面积检测器及其制造方法
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申请号： US13568593申请日： 2012-08-07
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公开(公告)号： US20130175431A1公开(公告)日： 2013-07-11
- 发明人: Dae-kun YOON , Young KIM , Jae-chul PARK , Sang-wook HAN , Sun-il KIM , Chang-jung KIM , Jun-su LEE
- 申请人： Dae-kun YOON , Young KIM , Jae-chul PARK , Sang-wook HAN , Sun-il KIM , Chang-jung KIM , Jun-su LEE
- 申请人地址： KR Suwon-si
- 专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址： KR Suwon-si
- 优先权： KR1020120002040 20120106
- 主分类号： H01L27/146
- IPC分类号： H01L27/146 ; H01L31/18
摘要：
A detector includes a substrate; two first regions, each first region having a linear shape, and the two first regions being separated from each other on the substrate and arranged in parallel; and a pixel region provided between the two first regions and including a plurality of pixels, the pixel region including a plurality of second regions perpendicular to the two first regions, each of the two first regions including a peripheral circuit portion, each of the plurality of second regions including a driver line, and a width of each of the plurality of second regions being equal to or less than a width of a single pixel.