A semiconductor apparatus includes a control chip including a first selection unit configured to output one of signals which are inputted through a first normal port and a shared test port, in response to a test mode signal; and a second selection unit configured to output one of signals which are inputted through a second normal port and the shared test port, in response to the test mode signal, wherein the control chip is configured to transmit an output of the first selection unit to a first chip and transmit an output of the second selection unit to a second chip.