发明申请
- 专利标题: METHOD AND DEVICE FOR DETECTING AN OBJECT IN A SUBSTRATE
- 专利标题(中): 用于检测基板中的对象的方法和装置
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申请号: US13549055申请日: 2012-07-13
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公开(公告)号: US20130182167A1公开(公告)日: 2013-07-18
- 发明人: Patrick Haldner , Christoph Wuersch , Wilfried Kaneider , Dietmar Schoenbeck , Sascha Korl
- 申请人: Patrick Haldner , Christoph Wuersch , Wilfried Kaneider , Dietmar Schoenbeck , Sascha Korl
- 申请人地址: LI Schaan
- 专利权人: Hilti Aktiengesellschaft
- 当前专利权人: Hilti Aktiengesellschaft
- 当前专利权人地址: LI Schaan
- 优先权: DE102011079258.9 20110715
- 主分类号: H04N5/232
- IPC分类号: H04N5/232
摘要:
A method and device for detecting an object in a substrate is disclosed. The device has a sensor unit having a sensor element and at least one further sensor element, a control and evaluation unit, and a display unit. The method for detecting an object in a substrate includes simultaneous reception of a receive signal and at least one further receive signal and simultaneous calculation of a depth cross-sectional image from the receive signal and at least one further depth cross-sectional image from the at least one further receive signal by the control and evaluation unit.
公开/授权文献
- US09398224B2 Method and device for detecting an object in a substrate 公开/授权日:2016-07-19