发明申请
- 专利标题: Calibration of Micro-Mirror Arrays
- 专利标题(中): 微镜阵列校准
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申请号: US13746149申请日: 2013-01-21
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公开(公告)号: US20130187669A1公开(公告)日: 2013-07-25
- 发明人: Murali Jayapala , Geert Van Der Plas , Veronique Rochus , Xavier Rottenberg , Simone Severi , Stéphane Donnay
- 申请人: IMEC
- 申请人地址: BE Leuven
- 专利权人: IMEC
- 当前专利权人: IMEC
- 当前专利权人地址: BE Leuven
- 优先权: EP12152010.0 20120120
- 主分类号: G02B27/00
- IPC分类号: G02B27/00
摘要:
A built-in self-calibration system and method for a micro-mirror array device, for example, operating as a variable focal length lens is described. The calibration method comprises determining a capacitance value for each micro-mirror element in the array device at a number of predetermined reference angles to provide a capacitance-reference angle relationship. From the capacitance values, an interpolation step is carried to determine intermediate tilt angles for each micro-mirror element in the array. A voltage sweep is applied to the micro-mirror array and capacitance values, for each micro-mirror element in the array, are measured. For a capacitance value that matches one of the values in the capacitance-reference angle relationship, the corresponding voltage is linked to the associated tilt angle to provide a voltage-tilt angle characteristic which then stored in a memory for subsequent use.
公开/授权文献
- US09201241B2 Calibration of micro-mirror arrays 公开/授权日:2015-12-01