发明申请
- 专利标题: Analysis Apparatus, Analysis Method and Analysis System
- 专利标题(中): 分析仪器,分析方法和分析系统
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申请号: US13581152申请日: 2011-02-01
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公开(公告)号: US20130197847A1公开(公告)日: 2013-08-01
- 发明人: Masashi Tsukada , Yasuhide Kusaka
- 申请人: Masashi Tsukada , Yasuhide Kusaka
- 申请人地址: JP Kyoto
- 专利权人: ARKRAY, Inc.
- 当前专利权人: ARKRAY, Inc.
- 当前专利权人地址: JP Kyoto
- 优先权: JP2010-043102 20100226
- 国际申请: PCT/JP2011/052018 WO 20110201
- 主分类号: G01R35/00
- IPC分类号: G01R35/00 ; G06F19/10
摘要:
Provided is an analysis apparatus capable of acquiring a measurement result with high reliability that includes: a signal detection unit; a measuring unit; a first temperature detection unit; a second temperature detection unit; and a calculation unit.
公开/授权文献
- US09588210B2 Analysis apparatus, analysis method and analysis system 公开/授权日:2017-03-07
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