Invention Application
- Patent Title: CALIBRATION METHOD, CALIBRATION DEVICE AND MEASUREMENT DEVICE
- Patent Title (中): 校准方法,校准装置和测量装置
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Application No.: US13762244Application Date: 2013-02-07
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Publication No.: US20130211761A1Publication Date: 2013-08-15
- Inventor: Ewout Brandsma , Maarten Christiaan Pennings , Aly Aamer Syed , Timo van Roermund
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP12154988.5 20120210
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G06F17/00

Abstract:
According to an aspect of the invention a method for calibrating a measurement device is conceived wherein: a calibration device is brought into close proximity of the measurement device such that a data communication link is established between the measurement device and the calibration device; wherein the following steps are performed while the calibration device and the measurement device are in close proximity of each other: the calibration device performs a measurement of at least one physical phenomenon; the measurement device performs a measurement of the same physical phenomenon; the result of the measurement by the measurement device is compared with the result of the measurement by the calibration device; and calibration parameters are computed based on a difference between the result of the measurement by the measurement device and the result of the measurement by the calibration device.
Public/Granted literature
- US10302468B2 Calibration method, calibration device and measurement device Public/Granted day:2019-05-28
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