发明申请
- 专利标题: MANUFACTURING METHOD OF A TEST STRIP
- 专利标题(中): 测试条的制造方法
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申请号: US13988475申请日: 2010-12-10
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公开(公告)号: US20130228266A1公开(公告)日: 2013-09-05
- 发明人: Wen-Pin Hsieh , Cheng-Hsien Wang , Ying-Te Wu , Yi-Chun Chen
- 申请人: Wen-Pin Hsieh , Cheng-Hsien Wang , Ying-Te Wu , Yi-Chun Chen
- 国际申请: PCT/CN2010/079669 WO 20101210
- 主分类号: B29D99/00
- IPC分类号: B29D99/00
摘要:
The present invention discloses a manufacturing method of a test strip, which comprises making a first semi-finished product and a second semi-finished product. The manufacturing process of the first semi-finished product comprises: providing a substrate, forming a plurality of electrodes on the substrate, forming a supporting layer with a plurality of channels on the substrate, and providing a reaction material to fill in the channels. The manufacturing process of the second semi-finished product comprises: providing a lid, forming a hydrophilic layer on a first surface of the lid, forming an adhesive layer on the first surface without the hydrophilic layer. Thereafter, a test strip assembly is formed by adhering the channels of the first semi-finished product to the hydrophilic layer of the second semi-finished product. Finally, a plurality of test strips are produced by cutting the test strip assembly along a first axis of the substrate.