发明申请
- 专利标题: Methods for Characterizing Tunable Radio-Frequency Elements
- 专利标题(中): 表征可调谐射频单元的方法
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申请号: US13415195申请日: 2012-03-08
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公开(公告)号: US20130234741A1公开(公告)日: 2013-09-12
- 发明人: Matthew A. Mow , Thomas E. Biedka , Liang Han , Rocco V. Dragone, JR. , Hongfei Hu , Dean F. Darnell , Joshua G. Nickel , Robert W. Schlub , Mattia Pascolini , Ruben Caballero
- 申请人: Matthew A. Mow , Thomas E. Biedka , Liang Han , Rocco V. Dragone, JR. , Hongfei Hu , Dean F. Darnell , Joshua G. Nickel , Robert W. Schlub , Mattia Pascolini , Ruben Caballero
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
公开/授权文献
- US09214718B2 Methods for characterizing tunable radio-frequency elements 公开/授权日:2015-12-15