发明申请
- 专利标题: METHOD OF CHARACTERIZING
- 专利标题(中): 表征方法
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申请号: US13882293申请日: 2011-10-26
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公开(公告)号: US20130241553A1公开(公告)日: 2013-09-19
- 发明人: Johan Van Den Brink , Ingmar Graesslin , Sascha Krueger , Steffen Weiss , Peter Vernickel
- 申请人: Johan Van Den Brink , Ingmar Graesslin , Sascha Krueger , Steffen Weiss , Peter Vernickel
- 申请人地址: NL Eindhoven
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP10189623.1 20101102
- 国际申请: PCT/IB2011/054771 WO 20111026
- 主分类号: G01R33/36
- IPC分类号: G01R33/36 ; G01R33/44
摘要:
The invention relates to a method of characterizing the RF transmit chain of a magnetic resonance imaging scanner (1) using a local transmit/receive coil system (204; 210), comprising a first local NMR probe and a first local magnetic resonance coil, the first NMR probe being spatially located in immediate neighborhood to the first coil, a local receive coil system (206; 208), comprising a second local NMR probe and a second local magnetic resonance coil, the second NMR probe being spatially located in immediate neighborhood to the second coil, wherein the transmit chain comprises an external MR coil (9; 11; 12; 13), the method comprising: determining with the first magnetic resonance coil, a first MR signal phase evolution of the local RF transmit field generated by MR excitation of the first probe using the first magnetic resonance coil by measuring the RF response of the first probe upon said excitation, determining with the second magnetic resonance coil a second MR signal phase evolution of the local RF transmit field generated by MR excitation of the second probe using the external MR coil (9; 11; 12; 13) by measuring the RF response of the second probe upon said excitation, calculating a phase offset between the first and second MR signal phase evolution.
公开/授权文献
- US09575146B2 Method of characterizing 公开/授权日:2017-02-21