发明申请
- 专利标题: RUN-TIME INSTRUMENTATION DIRECTED SAMPLING
- 专利标题(中): 运行时间仪表指示采样
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申请号: US13422532申请日: 2012-03-16
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公开(公告)号: US20130246741A1公开(公告)日: 2013-09-19
- 发明人: Charles W. Gainey, JR. , Marcel M. Mitran , Chung-Lung K. Shum , Kevin Stoodley
- 申请人: Charles W. Gainey, JR. , Marcel M. Mitran , Chung-Lung K. Shum , Kevin Stoodley
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F9/312
- IPC分类号: G06F9/312
摘要:
Embodiments of the invention relate to implementing run-time instrumentation directed sampling. An aspect of the invention includes fetching a run-time instrumentation next (RINEXT) instruction from an instruction stream. The instruction stream includes the RINEXT instruction followed by a next sequential instruction (NSI) in program order. The method further includes executing the RINEXT instruction by a processor. The executing includes determining whether a current run-time instrumentation state enables setting a sample point for reporting run-time instrumentation information during program execution. Based on the current run-time instrumentation state enabling setting the sample point, the NSI is a sample instruction for causing a run-time instrumentation event. Based on executing the NSI sample instruction, the run-time instrumentation event causes recording of run-time instrumentation information into a run-time instrumentation program buffer as a reporting group.
公开/授权文献
- US09465716B2 Run-time instrumentation directed sampling 公开/授权日:2016-10-11
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