Invention Application
- Patent Title: METHOD AND APPARATUS FOR MEASURING INTERFERENCE IN WIRELESS COMMUNICATION SYSTEM
- Patent Title (中): 用于测量无线通信系统干扰的方法和装置
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Application No.: US13848953Application Date: 2013-03-22
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Publication No.: US20130250788A1Publication Date: 2013-09-26
- Inventor: Younsun KIM , Hyojin LEE , Juho LEE , Kiil KIM
- Applicant: SAMSUNG ELECTRONICS CO. LTD.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co. Ltd.
- Current Assignee: Samsung Electronics Co. Ltd.
- Current Assignee Address: KR Suwon-si
- Main IPC: H04W24/10
- IPC: H04W24/10

Abstract:
An interference measurement method of a terminal is provided for facilitating downlink transmission in the mobile communication system based on Distributed Antenna System (DAS) in which multiple antennas controlled by a base station are distributed within the service area of the base station. The interference measurement method includes receiving channel measurement information and interference measurement information from a base station, receiving channel state information reference signals, calculating, when the received channel state information reference signal is for channel measurement, a received signal energy based on the channel measurement information and, when the received channel state information reference signal is for interference measurement, an interference based on the interference measurement information, generating channel quality information based on the received signal energy and the interference, and transmitting the channel quality information to the base station.
Public/Granted literature
- US09301181B2 Method and apparatus for measuring interference in wireless communication system Public/Granted day:2016-03-29
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