发明申请
US20130255385A1 X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN ITEMS 有权
用于检测物品中的差异的X射线背景系统和方法

X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN ITEMS
摘要:
A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.
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