发明申请
US20130280824A1 APPARATUS AND METHOD FOR MEASURING RADIATION ENERGY DURING THERMAL PROCESSING
有权
用于在热处理过程中测量辐射能量的装置和方法
- 专利标题: APPARATUS AND METHOD FOR MEASURING RADIATION ENERGY DURING THERMAL PROCESSING
- 专利标题(中): 用于在热处理过程中测量辐射能量的装置和方法
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申请号: US13903387申请日: 2013-05-28
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公开(公告)号: US20130280824A1公开(公告)日: 2013-10-24
- 发明人: Joseph M. Ranish , Blake Koelmel , Aaron Muir Hunter
- 申请人: Joseph M. Ranish , Blake Koelmel , Aaron Muir Hunter
- 主分类号: H01L21/66
- IPC分类号: H01L21/66
摘要:
Embodiments of the present invention provide apparatus and method for reducing heating source radiation influence in temperature measurement during thermal processing. In one embodiment of the present invention, background radiant energy, such as an energy source of a thermal processing chamber, is marked within a selected spectrum, a characteristic of the background is then determined by measuring radiant energy at a reference wavelength within the selected spectrum and a comparing wavelength just outside the selected spectrum.
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