发明申请
- 专利标题： ENABLING STATISTICAL TESTING USING DETERMINISTIC MULTI-CORNER TIMING ANALYSIS
- 专利标题（中）： 使用决定性多角度时序分析实现统计测试
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申请号： US13454795申请日： 2012-04-24
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公开(公告)号： US20130283223A1公开(公告)日： 2013-10-24
- 发明人: Bhavna Agrawal , David S. Kung , Jinjun Xiong , Vladimir Zolotov
- 申请人： Bhavna Agrawal , David S. Kung , Jinjun Xiong , Vladimir Zolotov
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
In one embodiment, the invention is a method and apparatus for variation enabling statistical testing using deterministic multi-corner timing analysis. One embodiment of a method for obtaining statistical timing data for an integrated circuit chip includes obtaining deterministic multi-corner timing data for the integrated circuit chip and constructing the statistical timing data from the deterministic multi-corner timing data.
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