发明申请
US20130299706A1 ANALYSIS APPARATUS FOR HIGH ENERGY PARTICLE AND ANALYSIS METHOD USING THE SAME
有权
用于高能粒子的分析装置和使用该方法的分析方法
- 专利标题: ANALYSIS APPARATUS FOR HIGH ENERGY PARTICLE AND ANALYSIS METHOD USING THE SAME
- 专利标题(中): 用于高能粒子的分析装置和使用该方法的分析方法
-
申请号: US13873708申请日: 2013-04-30
-
公开(公告)号: US20130299706A1公开(公告)日: 2013-11-14
- 发明人: Moon Youn JUNG , Nam Soo MYUNG , Dong-Ho SHIN , Hwang Woon LEE , Dong Hoon SONG , Seunghwan KIM
- 申请人: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 优先权: KR10-2012-0048689 20120508
- 主分类号: G01T1/20
- IPC分类号: G01T1/20
摘要:
Provided is an analysis apparatus for a high energy particle and an analysis method for a high energy particle. The analysis apparatus for the high energy particle includes a scintillator generating photons with each unique wavelength by the impinging with a plurality of kinds of accelerated high energy particles, a parallel beam converting unit making the photons proceed in parallel to one another, a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength, and a plurality of sensing units arranged on positions where the photons refracted at different angles from the diffraction grating panel reach in a state of being spatially separated, and detecting each of the photons.
公开/授权文献
信息查询