Invention Application
US20130301360A1 Data Storage in Analog Memory Cells Using Modified Pass Voltages
有权
使用修改的通过电压的模拟记忆单元中的数据存储
- Patent Title: Data Storage in Analog Memory Cells Using Modified Pass Voltages
- Patent Title (中): 使用修改的通过电压的模拟记忆单元中的数据存储
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Application No.: US13943131Application Date: 2013-07-16
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Publication No.: US20130301360A1Publication Date: 2013-11-14
- Inventor: Shai Winter , Ofir Shalvi
- Applicant: Apple Inc.
- Main IPC: G11C16/34
- IPC: G11C16/34

Abstract:
A method for data storage includes storing data in a target analog memory cell, which is one of a group of analog memory cells that are connected in series with one another, by writing a storage value into the target memory cell. The storage value written into the target memory cell is verified while biasing the other memory cells in the group with respective first pass voltages. After writing and verifying the storage value, the storage value is read from the target memory cell while biasing the other memory cells in the group with respective second pass voltages, wherein at least one of the second pass voltages applied to one of the other memory cells in the group is lower than a respective first pass voltage applied to the one of the other memory cells. The data is reconstructed responsively to the read storage value.
Public/Granted literature
- US08670274B2 Data storage in analog memory cells using modified pass voltages Public/Granted day:2014-03-11
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