发明申请
- 专利标题: ANALOG UNIT OF SEQUENCER SYSTEM
- 专利标题(中): 序列系统的模拟单元
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申请号: US13982347申请日: 2011-02-03
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公开(公告)号: US20130307523A1公开(公告)日: 2013-11-21
- 发明人: Satoshi Aoki , Hirokazu Nomoto , Tetsuya Tanaka
- 申请人: Satoshi Aoki , Hirokazu Nomoto , Tetsuya Tanaka
- 申请人地址: JP Chiyoda-ku, Tokyo
- 专利权人: MItsubishi Electric Corporation
- 当前专利权人: MItsubishi Electric Corporation
- 当前专利权人地址: JP Chiyoda-ku, Tokyo
- 国际申请: PCT/JP2011/052288 WO 20110203
- 主分类号: G01R19/165
- IPC分类号: G01R19/165
摘要:
An analog unit having a multiple-channel configuration among analog units included in a sequencer system is such that an AC signal as a measurement target, which is captured by a CT sensor, can be directly input to each of a plurality of channels, and the analog unit includes a setting unit that sets, in an internal memory, an abnormality-determination peak current value and an abnormal peak current duration, which are applied to the AC signal as a measurement target, for each of the channels, and a detecting unit that, when the AC signal as a measurement target includes an AC signal that maintains a state where a peak value exceeds the abnormality-determination peak current value for the abnormal peak current duration, detects generation of an abnormal alternating current in each of the channels.
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