Invention Application
- Patent Title: APPARATUS AND METHOD FOR INSPECTING SHORT CIRCUIT DEFECTS
- Patent Title (中): 检查短路电路缺陷的装置和方法
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Application No.: US13672031Application Date: 2012-11-08
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Publication No.: US20130307557A1Publication Date: 2013-11-21
- Inventor: June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-City
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-City
- Priority: KR10-2012-0053155 20120518
- Main IPC: G01R31/04
- IPC: G01R31/04 ; G01R31/08
Abstract:
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
Public/Granted literature
- US09361820B2 Apparatus and method for inspecting short circuit defects Public/Granted day:2016-06-07
Information query
