发明申请
- 专利标题: MEMORIES AND METHODS FOR PERFORMING COLUMN REPAIR
- 专利标题(中): 用于执行柱修复的记忆和方法
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申请号: US13483407申请日: 2012-05-30
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公开(公告)号: US20130326292A1公开(公告)日: 2013-12-05
- 发明人: Nicholas HENDRICKSON
- 申请人: Nicholas HENDRICKSON
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 主分类号: G11C29/00
- IPC分类号: G11C29/00
摘要:
Memory devices adapted to repair single unprogrammable cells during a program operation, and to repair columns containing unprogrammable cells during a subsequent erase operation. Programming of such memory devices includes determining that a single cell is unprogrammable and repairing the single cell, and repairing a column containing the single cell responsive to a subsequent erase operation.
公开/授权文献
- US09043661B2 Memories and methods for performing column repair 公开/授权日:2015-05-26
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