发明申请
- 专利标题: MEMORY ERROR TEST ROUTINE
- 专利标题(中): 内存错误测试程序
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申请号: US13485824申请日: 2012-05-31
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公开(公告)号: US20130326293A1公开(公告)日: 2013-12-05
- 发明人: Naveen Muralimanohar , Norman Paul Jouppi , Melvin K. Benedict , Andrew C. Walton
- 申请人: Naveen Muralimanohar , Norman Paul Jouppi , Melvin K. Benedict , Andrew C. Walton
- 主分类号: G11C29/08
- IPC分类号: G11C29/08 ; G06F11/26
摘要:
An error test routine is to test for a type of memory error by changing a content of a memory module. A memory handling procedure is to isolate the memory error in response to a positive outcome of the error test routine. The error test routine and memory handling procedure is to be performed at runtime transparent to an operating system. Information corresponding to isolating the memory error is stored.
公开/授权文献
- US08990646B2 Memory error test routine 公开/授权日:2015-03-24
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