发明申请
- 专利标题: SYSTEM FOR MEASURING LIGHT INTENSITY DISTRIBUTION
- 专利标题(中): 用于测量光强度分布的系统
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申请号: US13729285申请日: 2012-12-28
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公开(公告)号: US20130327960A1公开(公告)日: 2013-12-12
- 发明人: JUN ZHU , JING-LEI ZHU , KAI-LI JIANG , CHEN FENG , JI-QING WEI , GUO-FAN JIN , SHOU-SHAN FAN
- 申请人: JUN ZHU , JING-LEI ZHU , KAI-LI JIANG , CHEN FENG , JI-QING WEI , GUO-FAN JIN , SHOU-SHAN FAN
- 优先权: CN2012101920632 20120612
- 主分类号: G01J1/58
- IPC分类号: G01J1/58
摘要:
A system for measuring intensity distribution of light includes a carbon nanotube array located on a surface of a substrate, a reflector and an imaging element. The carbon nanotube array absorbs photons of a light source and radiates a visible light. The reflector is used to reflect the visible light, and the reflector is spaced from the carbon nanotube array. The carbon nanotube array is located between the reflector and the substrate. The imaging element is used to image the visible light. The imaging element is spaced from the substrate.
公开/授权文献
- US08981319B2 System for measuring light intensity distribution 公开/授权日:2015-03-17
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