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Invention Application
US20130334402A1 SOLID-STATE IMAGINGELEMENT, CALIBRATION METHOD OF SOLID-STATE IMAGINGELEMENT, SHUTTER DEVICE, AND ELECTRONIC APPARATUS 审中-公开
固态成像，固态成像校准方法，快门装置和电子装置

  • Patent Title: SOLID-STATE IMAGINGELEMENT, CALIBRATION METHOD OF SOLID-STATE IMAGINGELEMENT, SHUTTER DEVICE, AND ELECTRONIC APPARATUS
  • Patent Title (中): 固态成像，固态成像校准方法，快门装置和电子装置
  • Application No.: US13909881
    Application Date: 2013-06-04
  • Publication No.: US20130334402A1
    Publication Date: 2013-12-19
  • Inventor: Kyoko Izuha , Koji Kadono , Kouichi Harada , Toshiyuki Kobayashi
  • Applicant: Sony Corporation
  • Priority: JP2012-134861 20120614; JP2013-048221 20130311
  • Main IPC: H01L27/146
  • IPC: H01L27/146 ;  G02F1/01
SOLID-STATE IMAGINGELEMENT, CALIBRATION METHOD OF SOLID-STATE IMAGINGELEMENT, SHUTTER DEVICE, AND ELECTRONIC APPARATUS
Abstract:
Disclosed herein is a solid-state imaging element including: a plurality of pixels including a photoelectric conversion section; and a nano-carbon laminated film disposed on a side of a light receiving surface of the photoelectric conversion section and formed with a plurality of nano-carbon layers, transmittance of light and a wavelength region of transmissible light changing in the nano-carbon laminated film according to a voltage applied to the nano-carbon laminated film.
Abstract(Chinese):

本文公开了一种固态成像元件，包括：多个像素，包括光电转换部; 以及纳米碳层压膜，其设置在所述光电转换部的受光面的一侧，并且形成有多个纳米碳层，所述纳米碳层叠膜中的光的透射率和透射光的波长范围变化 根据施加到纳米碳层压膜的电压。

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