发明申请
- 专利标题: BLOCK LEVEL GRADING FOR RELIABILITY AND YIELD IMPROVEMENT
- 专利标题(中): 阻塞等级可靠性和成本提升
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申请号: US13527199申请日: 2012-06-19
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公开(公告)号: US20130336059A1公开(公告)日: 2013-12-19
- 发明人: Dana Lee , Jianmin Huang , Mrinal Kochar , Ashish Ghai
- 申请人: Dana Lee , Jianmin Huang , Mrinal Kochar , Ashish Ghai
- 申请人地址: US TX Plano
- 专利权人: SANDISK TECHNOLOGIES INC.
- 当前专利权人: SANDISK TECHNOLOGIES INC.
- 当前专利权人地址: US TX Plano
- 主分类号: G11C16/06
- IPC分类号: G11C16/06 ; G11C16/04
摘要:
A system for grading blocks may be used to improve memory usage. Blocks of memory, such as on a flash card, may be graded on a sliding scale that may identify a level of “goodness” or a level of “badness” for each block rather than a binary good or bad identification. This grading system may utilize at least three tiers of grades which may improve efficiency by better utilizing each block based on the individual grades for each block. The block leveling grading system may be used for optimizing the competing needs of minimizing yield loss while minimizing testing defect escapes.
公开/授权文献
- US08953398B2 Block level grading for reliability and yield improvement 公开/授权日:2015-02-10
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