Invention Application
US20130342098A1 Corrugated Dielectric for Reliable High-current Charge-emission Devices
审中-公开
用于可靠的大电流电荷发射器件的波纹电介质
- Patent Title: Corrugated Dielectric for Reliable High-current Charge-emission Devices
- Patent Title (中): 用于可靠的大电流电荷发射器件的波纹电介质
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Application No.: US14000418Application Date: 2012-03-13
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Publication No.: US20130342098A1Publication Date: 2013-12-26
- Inventor: Christopher E. Holland , Charles A. Spindt
- Applicant: Christopher E. Holland , Charles A. Spindt
- Applicant Address: US CA MENLO PARK
- Assignee: SRI INTERNATIONAL
- Current Assignee: SRI INTERNATIONAL
- Current Assignee Address: US CA MENLO PARK
- International Application: PCT/US12/28851 WO 20120313
- Main IPC: H01J1/88
- IPC: H01J1/88 ; H01J9/02

Abstract:
Micro-fabricated charge-emission devices comprise an electrically conductive gate electrode with an aperture, an electrically conductive base electrode, a charge-emitting microstructure extending from a surface in electrical contact with the base electrode and terminating near the aperture of the gate electrode, and a dielectric layer stack disposed between the base electrode and the gate electrode. The dielectric layer stack comprises a first dielectric layer and a second dielectric layer. The first dielectric layer is disposed between the second dielectric layer and the base electrode. The first dielectric layer is of a different selectively etchable dielectric material than the second dielectric layer. The dielectric layer stack h formed therein a cavity within which the charge-emitting emitting microstructure is disposed. The cavity has a corrugated wall shaped by the first dielectric layer undercutting the second dielectric layer. The corrugated wall surrounds the charge-emitting microstructure disposed within the cavity.
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