Invention Application
- Patent Title: INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS
- Patent Title (中): 检验系统和方法快速变化
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Application No.: US13923086Application Date: 2013-06-20
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Publication No.: US20130342893A1Publication Date: 2013-12-26
- Inventor: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- Applicant: APPLIED MATERIALS ISRAEL, LTD.
- Main IPC: G02F1/29
- IPC: G02F1/29

Abstract:
An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.
Public/Granted literature
- US08659754B2 Inspection system and method for fast changes of focus Public/Granted day:2014-02-25
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