Invention Application
- Patent Title: System and Method for Testing a Circuit
- Patent Title (中): 用于测试电路的系统和方法
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Application No.: US13721977Application Date: 2012-12-20
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Publication No.: US20140009162A1Publication Date: 2014-01-09
- Inventor: Jens BARRENSCHEEN , Dirk Hammerschmidt
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Main IPC: G01R31/327
- IPC: G01R31/327 ; G01R31/00

Abstract:
In an embodiment, a device comprises a circuit with at least one circuit element; measurement circuitry capable to test a state of the at least one circuit element during an operation of the circuit, the measurement circuitry comprising a first terminal configured to be coupled to a first node of the circuit via a first capacitor, a second terminal configured to be coupled to a second node of the circuit, wherein the measurement circuitry is configured to determine in situ an operating state of the at least one circuit element based on signals applied by the measurement circuitry to the circuit during the operation of the circuit.
Public/Granted literature
- US09188645B2 System and method for testing a circuit Public/Granted day:2015-11-17
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