A device for three-dimensional optical measurement of surfaces of arbitrary objects (2) using a pattern projection method, with a projector (3) for projecting patterns onto the surface (1) of the object (2), at least one camera (5) or imaging unit for recording the projected pattern and a computer for processing the image information recorded by the camera or the imaging unit to form 3D data, optionally for three-dimensional imaging of the object (2), is characterized in that the projector (3) only emits narrowband light and in that a filter apparatus is arranged in the detection beam path in front of the camera (5) or imaging unit, which filter apparatus is only transmissive to the wavelength range of the light emitted by the projector (3). A method application of the device according to the invention has a corresponding design.