Invention Application
US20140024074A1 YEAST CONCENTRATION AND VIABILITY MEASUREMENT 审中-公开
YEAST浓度和变异性测量

  • Patent Title: YEAST CONCENTRATION AND VIABILITY MEASUREMENT
  • Patent Title (中): YEAST浓度和变异性测量
  • Application No.: US13699647
    Application Date: 2011-06-06
  • Publication No.: US20140024074A1
    Publication Date: 2014-01-23
  • Inventor: Leo L. Chan
  • Applicant: Leo L. Chan
  • Applicant Address: US MA Lawrence
  • Assignee: NEXCELOM BIOSCIENCE LLC
  • Current Assignee: NEXCELOM BIOSCIENCE LLC
  • Current Assignee Address: US MA Lawrence
  • International Application: PCT/US11/39216 WO 20110606
  • Main IPC: C12Q1/06
  • IPC: C12Q1/06
YEAST CONCENTRATION AND VIABILITY MEASUREMENT
Abstract:
The invention generally relates to analyzing yeast viability. More particularly, the invention relates to efficient and effective methods and compositions for accessing and measuring viability and concentration of yeast cells.
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