Invention Application
US20140025336A1 SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APPARATUS 有权
形状测量装置的形状测量装置和形状测量装置的控制方法

  • Patent Title: SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APPARATUS
  • Patent Title (中): 形状测量装置的形状测量装置和形状测量装置的控制方法
  • Application No.: US13941880
    Application Date: 2013-07-15
  • Publication No.: US20140025336A1
    Publication Date: 2014-01-23
  • Inventor: Takashi NODAHiromi DEGUCHI
  • Applicant: Mitutoyo Corporation
  • Priority: JP2012-161772 20120720
  • Main IPC: G01B5/008
  • IPC: G01B5/008
SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APPARATUS
Abstract:
A control method of a shape measuring apparatus divides a curve indicating a movement path of a probe into a plurality of sections. A measurement target section is selected from the plurality of sections sequentially from a starting point side of the curve indicating the movement path of the probe. A first curvature radius is calculated from a curvature of the measurement target section. A second curvature radius is calculated according to an angle between a first straight line connecting a starting point to an ending point of the measurement target section and a second straight line connecting a starting point to an ending point of a section next to the measurement target section. A smaller value from among the first curvature radius and the second curvature radius is set as an effective radius. A maximum speed of probe movement increasing according to an increase in the effective radius is calculated for the measurement target section.
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