发明申请
- 专利标题: AUTOMATIC CONFIGURATION OF PROCESS DEFINITION METRICS
- 专利标题(中): 过程定义度量的自动配置
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申请号: US13553433申请日: 2012-07-19
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公开(公告)号: US20140025411A1公开(公告)日: 2014-01-23
- 发明人: Yi-Min CHEE , Daniel V. OPPENHEIM , Krishna C. RATAKONDA
- 申请人: Yi-Min CHEE , Daniel V. OPPENHEIM , Krishna C. RATAKONDA
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06Q10/00
- IPC分类号: G06Q10/00
摘要:
Various embodiments manage metrics in a business process management environment. In one embodiment, a business process is instantiated for execution. A set of process elements associated with the business process are identified. A set of metric configurations are accessed based on the business process being instantiated. A set of metrics is identified based on the set of metric configurations. Each of the set of metrics is associated with a process element type. At least one process elements in the set of process elements is automatically configured to collect at least one metric in the set of metrics based on the process element type of the at least one process element matching the process element type associated with the at least one metric.
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