发明申请
US20140032177A1 APPARATUS AND SYSTEM FOR DETERMINING, OPTIMIZING OR MONITORING AT LEAST ONE PROCESS VARIABLE
审中-公开
用于确定，优化或监控至少一个过程的装置和系统可变
- 专利标题： APPARATUS AND SYSTEM FOR DETERMINING, OPTIMIZING OR MONITORING AT LEAST ONE PROCESS VARIABLE
- 专利标题（中）： 用于确定，优化或监控至少一个过程的装置和系统可变
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申请号： US14009349申请日： 2012-03-15
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公开(公告)号： US20140032177A1公开(公告)日： 2014-01-30
- 发明人: Matthias Altendorf , Marc Bret
- 申请人： Matthias Altendorf , Marc Bret
- 申请人地址： DE Maulburg
- 专利权人： Endress + Hauser BmbH + Co. KG
- 当前专利权人： Endress + Hauser BmbH + Co. KG
- 当前专利权人地址： DE Maulburg
- 优先权： DE102011006989.5 20110407
- 国际申请： PCT/EP12/54533 WO 20120315
- 主分类号： G05B19/042
- IPC分类号： G05B19/042
摘要：
An apparatus for determining or monitoring at least one process variable which comprises a sensor element, measuring electronics, at least one control/evaluating/calculating unit arranged removed from the measuring unit and/or an in/output unit arranged removed from the measuring unit and the control/evaluating/calculating unit. The control/evaluating/calculating unit and the in/output unit are connected with the measuring unit via a first interface, respectively a second interface, wherein the measuring electronics operates the sensor element and forwards the measurement signals via the interfaces to the control/evaluating/calculating unit as unprocessed, raw, measured values, and wherein the control/evaluating/calculating unit arranged removed from the measuring unit determines, improves and/or monitors the process variable based on the raw, measured values and makes such available via the in/output unit.
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