Invention Application
- Patent Title: ENDOSCOPE APPARATUS AND MEASURING METHOD
- Patent Title (中): 内窥镜装置和测量方法
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Application No.: US14061530Application Date: 2013-10-23
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Publication No.: US20140052005A1Publication Date: 2014-02-20
- Inventor: Masayoshi YOKOTA
- Applicant: OLYMPUS CORPORATION
- Priority: JP2011-099889 20110427; JP2011-099890 20110427
- Main IPC: A61B5/107
- IPC: A61B5/107 ; A61B1/00 ; A61B1/06 ; A61B5/00 ; A61B1/05

Abstract:
An endoscope apparatus and a measuring method measure a subject using a pattern projection image obtained by projecting a fringe pattern onto a subject. The endoscope apparatus includes an elongated insertion section, an imaging section at a tip portion of the insertion section to acquire the image of a subject, an illumination section at the tip portion of the insertion section to emit the illumination light that illuminates an observation visual field of the imaging section, and a pattern projection section at the tip portion of the insertion section to project a fringe pattern onto the subject. A tip surface of the insertion section includes an objective optical system that forms the image of the subject on the imaging section, one or more illumination windows through which illumination light is emitted, and one projection window through which a fringe pattern is projected onto the subject from the pattern projection section.
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