发明申请
- 专利标题: High Temperature, High Bandwidth Pressure Acquisition System
- 专利标题(中): 高温,高带宽压力采集系统
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申请号: US14076835申请日: 2013-11-11
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公开(公告)号: US20140067288A1公开(公告)日: 2014-03-06
- 发明人: Anthony D. Kurtz , Alexander A. Ned , Joseph R. VanDeWeert
- 申请人: Nora Kurtz
- 申请人地址: US NJ Leonia
- 专利权人: KULITE SEMICONDUCTOR PRODUCTS, INC.
- 当前专利权人: KULITE SEMICONDUCTOR PRODUCTS, INC.
- 当前专利权人地址: US NJ Leonia
- 主分类号: G01L9/00
- IPC分类号: G01L9/00 ; G01L9/06
摘要:
A method, device and system are provided for measuring multiple pressures under severe conditions. In one embodiment, a method comprises receiving, by a processor, from a first sensor, a first pressure signal; receiving, by the processor, from a second sensor, a second pressure signal; receiving, by the processor, from a first memory, a first correction coefficient for the first sensor; receiving, by the processor, from a second memory, a second correction coefficient for the second sensor; modifying, by the processor, the first pressure signal using the first correction coefficient to generate a first corrected pressure signal; modifying, by the processor, the second pressure signal using the second correction coefficient to generate a second corrected pressure signal; and outputting, by the processor, the first corrected pressure signal and the second corrected pressure signal.
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