Invention Application
US20140095963A1 PATTERN-DEPENDENT SHORT MEDIA DEFECT DETECTION 有权
模式相关短缺媒体缺陷检测

  • Patent Title: PATTERN-DEPENDENT SHORT MEDIA DEFECT DETECTION
  • Patent Title (中): 模式相关短缺媒体缺陷检测
  • Application No.: US13631075
    Application Date: 2012-09-28
  • Publication No.: US20140095963A1
    Publication Date: 2014-04-03
  • Inventor: Fan ZhangWu Chang
  • Applicant: LSI CORPORATION
  • Applicant Address: US CA Milpitas
  • Assignee: LSI CORPORATION
  • Current Assignee: LSI CORPORATION
  • Current Assignee Address: US CA Milpitas
  • Main IPC: G06F11/00
  • IPC: G06F11/00 G06F7/04
PATTERN-DEPENDENT SHORT MEDIA DEFECT DETECTION
Abstract:
Systems and methods for computing sign disagreement between Le and La signals may implement one or more operations including, but not limited to: receiving an extrinsic log likelihood ratio (LLR) value; incrementing a sign-disagreement counter according to a sign disagreement between the extrinsic LLR value and an a priori LLR value; providing a value of the sign-disagreement counter to a binary short media defect (SMD) detector.
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