Invention Application
- Patent Title: PATTERN-DEPENDENT SHORT MEDIA DEFECT DETECTION
- Patent Title (中): 模式相关短缺媒体缺陷检测
-
Application No.: US13631075Application Date: 2012-09-28
-
Publication No.: US20140095963A1Publication Date: 2014-04-03
- Inventor: Fan Zhang , Wu Chang
- Applicant: LSI CORPORATION
- Applicant Address: US CA Milpitas
- Assignee: LSI CORPORATION
- Current Assignee: LSI CORPORATION
- Current Assignee Address: US CA Milpitas
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F7/04

Abstract:
Systems and methods for computing sign disagreement between Le and La signals may implement one or more operations including, but not limited to: receiving an extrinsic log likelihood ratio (LLR) value; incrementing a sign-disagreement counter according to a sign disagreement between the extrinsic LLR value and an a priori LLR value; providing a value of the sign-disagreement counter to a binary short media defect (SMD) detector.
Public/Granted literature
- US09026876B2 Pattern-dependent short media defect detection Public/Granted day:2015-05-05
Information query