发明申请
- 专利标题: Terahertz Wave Measurement Device and Method
- 专利标题(中): 太赫兹波测量装置及方法
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申请号: US13857249申请日: 2013-04-05
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公开(公告)号: US20140097344A1公开(公告)日: 2014-04-10
- 发明人: Takayuki Hasebe , Hitoshi Tabata , Shigeru Kitamura
- 申请人: Takayuki Hasebe , Hitoshi Tabata , Shigeru Kitamura
- 申请人地址: JP Kyoto JP Tokyo
- 专利权人: ARKRAY, INC.,THE UNIVERSITY OF TOKYO
- 当前专利权人: ARKRAY, INC.,THE UNIVERSITY OF TOKYO
- 当前专利权人地址: JP Kyoto JP Tokyo
- 优先权: JP2012-224555 20121009
- 主分类号: G01N21/59
- IPC分类号: G01N21/59 ; G01N21/01
摘要:
The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves.
公开/授权文献
- US08969805B2 Terahertz wave measurement device and method 公开/授权日:2015-03-03
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