Invention Application
- Patent Title: NITRIDE SEMICONDUCTOR STRUCTURE
- Patent Title (中): 氮化物半导体结构
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Application No.: US14049209Application Date: 2013-10-09
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Publication No.: US20140103354A1Publication Date: 2014-04-17
- Inventor: Chih-Wei Hu , Chen-Zi Liao , Yen-Hsiang Fang , Rong Xuan
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Priority: TW101137770 20121012
- Main IPC: H01L29/205
- IPC: H01L29/205

Abstract:
A nitride semiconductor structure including a silicon substrate, a nucleation layer, a buffer layer and a nitride semiconductor layer is provided. The nucleation layer disposed on the silicon substrate includes a cubic silicon carbon nitride (SiCN) layer. The buffer layer is disposed on the nucleation layer. The nitride semiconductor layer is disposed on the buffer layer.
Information query
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