发明申请
US20140104559A1 DISPLAY PANEL AND METHOD OF INSPECTING CURED STATE OF SEALING MATERIAL BASED ON FOURIER TRANSFORM INFRARED SPECTROSCOPY 审中-公开
基于FOURIER变换红外光谱的显示面板和密封材料固化状态检测方法

  • 专利标题: DISPLAY PANEL AND METHOD OF INSPECTING CURED STATE OF SEALING MATERIAL BASED ON FOURIER TRANSFORM INFRARED SPECTROSCOPY
  • 专利标题(中): 基于FOURIER变换红外光谱的显示面板和密封材料固化状态检测方法
  • 申请号: US14123380
    申请日: 2012-05-29
  • 公开(公告)号: US20140104559A1
    公开(公告)日: 2014-04-17
  • 发明人: Takafumi Hayama
  • 申请人: Takafumi Hayama
  • 申请人地址: JP Osaka-shi, Osaka
  • 专利权人: SHARP KABUSHIKI KAISHA
  • 当前专利权人: SHARP KABUSHIKI KAISHA
  • 当前专利权人地址: JP Osaka-shi, Osaka
  • 优先权: JP2011-125323 20110603
  • 国际申请: PCT/JP2012/063704 WO 20120529
  • 主分类号: G02F1/1339
  • IPC分类号: G02F1/1339
DISPLAY PANEL AND METHOD OF INSPECTING CURED STATE OF SEALING MATERIAL BASED ON FOURIER TRANSFORM INFRARED SPECTROSCOPY
摘要:
A display panel (100A) according to an embodiment of the present invention includes a first substrate (12) having an end region (12p) and a pixel formation region (12D), a second substrate (22) arranged so as to face the first substrate (12) and expose the end region (12p) of the first substrate (12), a display medium layer (32) arranged between the first substrate (12) and the second substrate (22), a sealing portion (42a) configured to bond the first substrate (12) to the second substrate (22) and surround the pixel formation region (12D), and an additional sealing portion (44a) arranged in the end region (12p) of the first substrate (12), the additional sealing portion (44a) being composed of the same material as that of the sealing portion (42a), in which the first substrate (12) further includes a metal layer (14a) below the additional sealing portion (44a). In the display panel (100A), it is possible to evaluate the cured state of the sealing material of the additional sealing portion (44a) by Fourier transform infrared spectroscopy.
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