Invention Application
- Patent Title: OXIDE FILM DEPOSITION METHOD AND OXIDE FILM DEPOSITION DEVICE
- Patent Title (中): 氧化膜沉积方法和氧化膜沉积装置
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Application No.: US14131128Application Date: 2011-09-13
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Publication No.: US20140141170A1Publication Date: 2014-05-22
- Inventor: Hiroyuki Orita , Takahiro Shirahata , Takahiro Hiramatsu
- Applicant: Hiroyuki Orita , Takahiro Shirahata , Takahiro Hiramatsu
- Applicant Address: JP Minato-ku,Tokyo
- Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee: TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Current Assignee Address: JP Minato-ku,Tokyo
- International Application: PCT/JP2011/070783 WO 20110913
- Main IPC: B05D3/04
- IPC: B05D3/04 ; B05C5/00

Abstract:
The present invention provides a method for forming an oxide film by which normal formation of an oxide film is always achieved without receiving an influence of a change in the atmosphere, a metal oxide film having a low resistance can be formed, and a high efficiency of film formation is obtained. In the present invention, a raw material solution containing an alkyl compound is formed into a mist and ejected to a substrate (100) in the atmosphere. Additionally, an oxidizing agent that exerts an oxidizing effect on the alkyl compound is supplied to the mist of the raw material solution. Through the above-described processes, an oxide film is formed on the substrate in the present invention.
Public/Granted literature
- US10016785B2 Oxide film deposition method and oxide film deposition device Public/Granted day:2018-07-10
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