发明申请
US20140153775A1 SIMILARITY DETERMINATION APPARATUS, SIMILARITY DETERMINATION SYSTEM, AND SIMILARITY DETERMINATION METHOD
审中-公开
相似性测定装置，相似性测定系统和相似性测定方法
- 专利标题： SIMILARITY DETERMINATION APPARATUS, SIMILARITY DETERMINATION SYSTEM, AND SIMILARITY DETERMINATION METHOD
- 专利标题（中）： 相似性测定装置，相似性测定系统和相似性测定方法
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申请号： US14083871申请日： 2013-11-19
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公开(公告)号： US20140153775A1公开(公告)日： 2014-06-05
- 发明人: Go MARUYAMA , Kensuke Masuda , Yuji Yamanaka
- 申请人： Go MARUYAMA , Kensuke Masuda , Yuji Yamanaka
- 优先权： JP2012-264305 20121203; JP2013-204755 20130930
- 主分类号： G06K9/00
- IPC分类号： G06K9/00
摘要：
A similarity determination apparatus, a similarity determination system, and a similarity determination method are provided, each of which calculates spectral information of an object, transforms the spectral information of the object into characteristic quantity, generates a similarity determination criterion from one or a plurality of items of characteristic quantity of a reference item, and checks the characteristic quantity of the object against the similarity determination criterion to determine similarity of the object with reference to the reference item.