发明申请
- 专利标题: METHOD AND APPARATUS TO PREWET WAFER SURFACE
- 专利标题(中): 方法和装置调整水面
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申请号: US14077756申请日: 2013-11-12
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公开(公告)号: US20140154405A1公开(公告)日: 2014-06-05
- 发明人: Yue Ma , David Wang
- 申请人: Yue Ma , David Wang
- 申请人地址: CN Shanghai
- 专利权人: ACM Research (Shanghai) Inc.
- 当前专利权人: ACM Research (Shanghai) Inc.
- 当前专利权人地址: CN Shanghai
- 主分类号: H05K3/46
- IPC分类号: H05K3/46
摘要:
The present invention improves the wetting between process solution and the wafer surface when they are put into contact by pre-implementing an adsorbed liquid layer on the entire front surface of the wafer just prior to the process. The pre-implementing adsorbed liquid layer is realized by transporting vaporized liquid molecules from vapor phase at elevated temperature (relative to wafer) and condensing them onto wafer surface. The pre-implementing adsorbed liquid is fully filled in the patterned structures formed on the wafer by multilayer absorption of the vaporized liquid molecules and the temperature of the wafer surface is above dew point of the vaporized liquid while condensing, which avoids generating bubbles inside the patterned structures.
公开/授权文献
- US09295167B2 Method to prewet wafer surface 公开/授权日:2016-03-22
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